Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach

نویسندگان

  • Nagarajan Raghavan
  • Daniel D. Frey
  • Michel Bosman
  • Kin Leong Pey
چکیده

Article history: Received 27 May 2015 Received in revised form 17 June 2015 Accepted 18 June 2015 Available online xxxx

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015